By Ladislaus Marton
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Extra info for Advances in Electronics and Electron Phisics. Vol. 43
DONELLI A N D L . , 1975) the degree of indeterminancy in the knowledge of the actual magnification of each section of A,and the compressions and distortions of the lattice as a consequence of the specimen preparation procedures. These are all causes that will make for different values for the same spacing. In spite of the limitations due to these sources of error, it is generally possible to reconstruct the reciprocal lattice M and from this to calculate the lattice M . This method makes it possible to trace back to a series of structural parameters, such as dimensions and volume of the crystal unit cell.
62), it can then be seen that the autocorrelation function of phase noise is proportional to the diffraction pattern of the system aperture. Qualitatively, this means that the average dimensions of the speckles constituting the pattern defined by Eq. , to the dimensions of b ( x , , yl). IV. APPLICATIONS A . Contrast Transfer Function of an Electron Microscope A correct interpretation of the phase contrast image is subordinate to adequate knowledge of contrast transfer function (CTF) of the electron-optical channel under the specific operating conditions.
IV. Surface Charge Storage A. Williams Storage ........................... VI. Alternative Storage A. Amorphous Sem B. Magnetic Storag . . . . . . . . . 56 . . . . . . . 92 ............. 99 ............. D. Ferroelectric Media .................................. VII. Electron-Optical Systems ............................................ 112 112 ...................... 135 ents ......... I. INTRODUCTION The promise of the electron beam as a means of addressing large quantities of digital information with high speed and low systems cost has intrigued many workers since the early days of modern computing machines.